Reply to the Comment on ``Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers''
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❄️ cond-mat.str-el
cond-mat.dis-nn
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commentcond-matreplychargeddensityearlierimpurityinversion
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This is a Reply to the Comment (cond-mat/9812331) by Kravchenko et al. on our earlier work (cond-mat/9812216).
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