On X-Ray Waveguiding in Nanochannels: Channeling Formalism

The question on X-ray extreme focusing (smallest reachable spot size) brings us to the idea for using the wave features of X-ray propagation in media. As known, wave features are revealed at propagation in ultra-narrow collimators as well as at glancing reflection from smooth flat and/or strongly curved surfaces. All these phenomena can be described within the general formalism of X-ray channeling.