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Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

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arxiv 2305.17762 v1 pith:5SGPC3OZ submitted 2023-05-28 physics.ins-det hep-ex

classification physics.ins-dethep-ex
keywords sipmchargedparticlesbeencellscherenkovdetectiondifferent
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In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.

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Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. Full citation record

  1. Efficient and precise Cherenkov-based charged particle timing using SiPMs

    physics.ins-det 2026-01 conditional novelty 4.0 of 10

    A Monte Carlo study predicts sub-30 ps time resolution for charged particles using thin fused-silica Cherenkov radiators coupled to SiPMs, consistent with earlier ~46 ps beam tests.

  2. Particle Identification at Future Colliders

    hep-ex 2026-08 accept

    A conference review surveys current R&D for charged-hadron identification at future colliders; it reports no new measurement or derivation.

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