Extrinsic Limitations of Stealthy Hyperuniform devices
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Hyperuniformity promises an unusual form of wave control: the suppression of elastic scattering over extended angular ranges without periodic order. Here, we present a comprehensive experimental and theoretical study of 2D stealthy hyperuniform metasurfaces operating at optical frequencies. In agreement with theoretical expectations, we observe a pronounced reduction of elastic scattering around the specular direction in metasurfaces fabricated by electron-beam lithography. However, the measured suppression is substantially weaker than that predicted by structure-factor calculations based on ideal stealthy hyperuniform point-pattern generators. We identify and quantitatively analyze the physical origins of this discrepancy and establish realistic performance bounds. By isolating the dominant limiting mechanisms, our results provide practical design guidelines for the implementation of stealthy hyperuniformity in functional devices.
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Spectral Leakage and Masking Effects in the Measurement of Hyperuniformity
Finite observation windows and masks induce a universal k² leakage term in the measured structure factor of hyperuniform systems at small k, with the true exponent α visible only in an intermediate regime.
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