Elena M. Echeverria
Identifiers
- name variant Elena M. Echeverria 0.50 · backfill
Papers (1)
- Critical-point model dielectric function analysis of WO$_3$ thin films deposited by atomic layer deposition techniques cond-mat.mtrl-sci · 2018 · author #5
Mentions
No mention provenance yet.
Frequent Coauthors
- Alyssa Mock 1 shared papers
- Derek Sekora 1 shared papers
- Eva Franke-Schubert 1 shared papers
- Mathias M. Schubert 1 shared papers
- Natale J. Ianno 1 shared papers
- Rafal Korlacki 1 shared papers
- Ufuk Kilic 1 shared papers