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M Zdrojek

Identifiers

  • name variant M Zdrojek 0.60 · backfill

Papers (1)

  1. Characterization of ion/electron beam induced deposition of electrical contacts at the sub-{\mu}m scale cond-mat.mes-hall · 2011 · author #5

Mentions

  • 1103.1975 #5 · backfill · confidence 0.70 M Zdrojek

Frequent Coauthors