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D. Manessis

Identifiers

  • name variant D. Manessis 0.60 · backfill

Papers (2)

  1. Three Dimensionial Surface Modelling: A Novel Analysis Technique for Non-Destructive X-Ray Diffraction Imaging of Semiconductor Die Warpage & Strain in Fully Encapsulated Integrated Circuits cond-mat.mtrl-sci · 2012 · author #5
  2. Lamination And Microstructuring Technology for a Bio-Cell Multiwell array cs.OH · 2008 · author #2

Mentions

  • 1204.1466 #5 · backfill · confidence 0.70 D. Manessis
  • 0802.3082 #2 · backfill · confidence 0.70 D. Manessis

Frequent Coauthors