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M. Jaksic

Identifiers

  • name variant M. Jaksic 0.60 · backfill

Papers (9)

  1. Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy cond-mat.mtrl-sci · 2016 · author #5
  2. Finite element analysis of ion-implanted diamond surface swelling cond-mat.mtrl-sci · 2016 · author #6
  3. Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode physics.ins-det · 2016 · author #4
  4. Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization cond-mat.mtrl-sci · 2016 · author #6
  5. Charge collection efficiency mapping of interdigitated 4H-SiC detectors physics.ins-det · 2016 · author #5
  6. Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes physics.ins-det · 2016 · author #3
  7. IBIC characterization of an ion-beam-micromachined multi-electrode diamond detector physics.ins-det · 2016 · author #3
  8. Nanostructuring Graphene by Dense Electronic Excitation cond-mat.mtrl-sci · 2015 · author #8
  9. Measurement and modelling of anomalous polarity pulses in a multi-electrode diamond detector cond-mat.mtrl-sci · 2013 · author #3

Mentions

  • 1509.03043 #8 · backfill · confidence 0.70 M. Jaksic
  • 1312.4734 #3 · backfill · confidence 0.70 M. Jaksic

Frequent Coauthors