Perspective advocating APT for quantitative 3D defect mapping in hafnia ferroelectrics, including a proof-of-concept atomic-scale reconstruction in a device stack.
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cond-mat.mtrl-sci 1years
2026 1verdicts
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Atom Probe Tomography as an Emerging Tool for Understanding Defect-driven Mechanisms in HfO$_{2}$-based Ferroelectrics
Perspective advocating APT for quantitative 3D defect mapping in hafnia ferroelectrics, including a proof-of-concept atomic-scale reconstruction in a device stack.