FID OPM with two-axis micromirror scanning achieves 0.5 pT/sqrt(Hz) sensitivity and resolves 2 mm features in PCBs, ICs, and batteries at 2.7 mm standoff.
Measurement and simulation of the magnetic fields from a 555 timer integrated circuit using a quantum diamond microscope and finite-element analysis,
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High-Resolution Atomic Magnetometer-Based Imaging of Integrated Circuits and Batteries
FID OPM with two-axis micromirror scanning achieves 0.5 pT/sqrt(Hz) sensitivity and resolves 2 mm features in PCBs, ICs, and batteries at 2.7 mm standoff.