Nano-fabricated free-standing wire scanners with about 250 nm geometric resolution measured 400-500 nm tall electron beams at SwissFEL and survived nominal 200 pC operation.
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Nano-Fabricated Free-Standing Wire-Scanners with Sub-Micrometer Resolution
Nano-fabricated free-standing wire scanners with about 250 nm geometric resolution measured 400-500 nm tall electron beams at SwissFEL and survived nominal 200 pC operation.