Unsupervised clustering of diffraction pattern similarity segments 4D-STEM data into spatially contiguous crystallographic domains, enabling data reduction by orders of magnitude and improved averaged patterns for phase, orientation, and strain analysis.
Assessment of active dopants and p–n junction abruptness using in situ biased 4d-stem.Nano Letters, 22(23): 9544–9550
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Unsupervised segmentation and clustering workflow for efficient processing of 4D-STEM and 5D-STEM data
Unsupervised clustering of diffraction pattern similarity segments 4D-STEM data into spatially contiguous crystallographic domains, enabling data reduction by orders of magnitude and improved averaged patterns for phase, orientation, and strain analysis.