Early-stage formation and evolution of light-emitting defects in Ag-based memristors are studied via correlated electrical and optical measurements to enable control of emission in neuromorphic devices.
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Formation of Light-Emitting Defects in Ag-based Memristors
Early-stage formation and evolution of light-emitting defects in Ag-based memristors are studied via correlated electrical and optical measurements to enable control of emission in neuromorphic devices.