DFT predicts stacking faults in wurtzite and zincblende GaN are type II interfaces that locally shrink the band gap, with I1 the most stable fault in wurtzite.
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DFT modelling of stacking faults in hexagonal and cubic GaN
DFT predicts stacking faults in wurtzite and zincblende GaN are type II interfaces that locally shrink the band gap, with I1 the most stable fault in wurtzite.