A full-simulation study of the FCC-ee IDEA vertex detector shows it meets its impact-parameter targets, and a curved wafer-scale MAPS concept reduces material by about three times.
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Design, performance and future prospects of vertex detectors at the FCC-ee
A full-simulation study of the FCC-ee IDEA vertex detector shows it meets its impact-parameter targets, and a curved wafer-scale MAPS concept reduces material by about three times.