Analytical ptychography can image beam-sensitive specimens at very low electron doses, with dose requirement proportional to the reconstructed frequency surface and comparable per-frequency dose efficiency across WDD, SBI-D and iCoM.
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Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
Analytical ptychography can image beam-sensitive specimens at very low electron doses, with dose requirement proportional to the reconstructed frequency surface and comparable per-frequency dose efficiency across WDD, SBI-D and iCoM.