The authors combine edge-based smoothed finite elements with element splitting and a local energy-release-rate criterion to track dynamic crack growth in 2D, validating on Kalthoff plates, concrete beams, and PMMA specimens.
Progress in the development and understanding of advanced low k and ultralow k dielectrics for very large-scale integrated interconnects—state of the art,
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A Practical Finite Element Approach for Simulating Dynamic Crack Growth in Cu/Ultra Low-k Interconnect Structures
The authors combine edge-based smoothed finite elements with element splitting and a local energy-release-rate criterion to track dynamic crack growth in 2D, validating on Kalthoff plates, concrete beams, and PMMA specimens.