A new statistical microlocal analysis derives the power of a hypothesis test for edge detectability in 2D X-ray CT from noisy discrete Radon data, validated by simulations.
This shows that the desired confidence region is the ellipsoidE r(F), wherer=−2 lnα
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Statistical microlocal analysis in two-dimensional X-ray CT
A new statistical microlocal analysis derives the power of a hypothesis test for edge detectability in 2D X-ray CT from noisy discrete Radon data, validated by simulations.