Ultra-thin large-diameter silicon nitride vacuum windows for soft X-ray applications were developed, pressure-tested, and characterized for X-ray transparency at a synchrotron.
Hitchcock,Soft x-ray spectromicroscopy and ptychography,Journal of Electron Spectroscopy and Related Phenomena200(2015) 49
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
citation-role summary
background 1
citation-polarity summary
fields
hep-ex 1years
2026 1verdicts
UNVERDICTED 1roles
background 1polarities
background 1representative citing papers
citing papers explorer
-
Characterization of large diameter ultra-thin vacuum windows for soft X-ray applications
Ultra-thin large-diameter silicon nitride vacuum windows for soft X-ray applications were developed, pressure-tested, and characterized for X-ray transparency at a synchrotron.