A true ACSTM method uses pure alternating current for feedback to achieve atomic-resolution tunneling on insulators, demonstrated on 25 nm silicon oxide at 10 MHz.
layer hasZ CSiO2 = 2.7×10 10Ω, while the tunneling junc- tion hasZ tunnel = 8.3×10 6Ω (see Fig
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True Alternating Current Scanning Tunneling Microscope (ACSTM): tunneling on insulators
A true ACSTM method uses pure alternating current for feedback to achieve atomic-resolution tunneling on insulators, demonstrated on 25 nm silicon oxide at 10 MHz.