The skyrmion lattice in MnSi shows both Hall and longitudinal emergent reactance only during current-driven creep motion, attributed to skyrmion mass and internal deformation modes.
A FEI Helios 5UX focused ion beam instrument was u sed to fabricate the thin- plate devices from the single crystal
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Emergent reactance induced by the deformation of a current-driven skyrmion lattice
The skyrmion lattice in MnSi shows both Hall and longitudinal emergent reactance only during current-driven creep motion, attributed to skyrmion mass and internal deformation modes.