For thin insulating layers on a conductor, the point spread function of a surface-charge signal in SKPM has the same shape as the work-function point spread function, scaled by the layer thickness divided by its permittivity.
Fang , author C
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A duality between surface charge and work function in scanning Kelvin probe microscopy
For thin insulating layers on a conductor, the point spread function of a surface-charge signal in SKPM has the same shape as the work-function point spread function, scaled by the layer thickness divided by its permittivity.