A new statistical microlocal analysis derives the power of a hypothesis test for edge detectability in 2D X-ray CT from noisy discrete Radon data, validated by simulations.
2.σ 2(α, ⃗ α·x0)̸= 0for allαin some open setΩ⊂[0,2π]
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Statistical microlocal analysis in two-dimensional X-ray CT
A new statistical microlocal analysis derives the power of a hypothesis test for edge detectability in 2D X-ray CT from noisy discrete Radon data, validated by simulations.