Presents an improved add-on module for high-speed time-resolved scanning probe microscopy on commercial instruments with added AFM compatibility and atom tracking.
Experimental and Theoretical Study of the Rotation of Si Ad-Dimers on the Si(100) Surface
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The new FAST module: a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Presents an improved add-on module for high-speed time-resolved scanning probe microscopy on commercial instruments with added AFM compatibility and atom tracking.