The new FAST module: a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Pith reviewed 2026-05-25 19:12 UTC · model grok-4.3
The pith
A redesigned FAST module adds portable high-speed operation to commercial STMs and AFMs at and beyond video rates with atom tracking.
A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.
Core claim
The new FAST module is a portable and transparent add-on instrument that drives commercial STMs and AFMs at and beyond video-rate frequencies, with improved performance and user experience plus an atom tracking mode, and all features including cross-instrument portability are described and demonstrated in practice.
What carries the argument
The FAST module, a portable transparent add-on that interfaces with existing commercial STMs and AFMs to enable high-frequency scanning and atom tracking without replacing or extensively modifying the original controller.
If this is right
- Dynamical surface processes such as diffusion, film growth, self-assembly, and chemical reactions become accessible to detailed time-resolved study.
- The same module works with both STMs and AFMs on multiple commercial platforms.
- An atom tracking mode supplies additional measurement capability beyond standard imaging.
- User experience and overall performance exceed those of the earlier prototype.
Where Pith is reading between the lines
- Labs could adopt high-speed SPM capability by adding one device instead of buying new microscopes.
- The portable design opens the possibility of moving the module between different research sites for shared experiments.
- High-speed atom tracking could be combined with other modes such as spectroscopy in later versions.
Load-bearing premise
The module can be attached to a range of commercial instruments to reach the stated speeds and tracking performance while leaving the original microscope's functions intact and without needing extensive custom modifications.
What would settle it
A side-by-side test on a standard commercial STM showing that attaching the module either prevents video-rate imaging or requires major changes to the microscope's native operation would falsify the claim.
read the original abstract
Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
Editorial analysis
A structured set of objections, weighed in public.
Referee Report
Summary. The manuscript describes a fully redesigned FAST module as a portable, transparent add-on for commercial STMs and AFMs. It enables imaging at and beyond video-rate frequencies, adds an atom-tracking mode, and improves performance and user experience relative to an earlier prototype. Detailed hardware descriptions, interface diagrams, performance benchmarks across multiple instruments, and explicit demonstrations of the atom-tracking mode are included.
Significance. If the reported performance and integration claims hold, the module offers a practical route for time-resolved surface studies on existing commercial instruments without requiring full replacement or extensive custom modifications. The emphasis on portability between instruments and the provision of reproducible hardware details and benchmarks constitute a concrete contribution to SPM instrumentation.
minor comments (3)
- [Abstract] The abstract states that demonstrations were performed but does not quote the achieved frame rates or image sizes; adding these numbers would improve immediate readability.
- [Hardware section] Figure captions for the interface diagrams would benefit from explicit cross-references to the signal-flow description in the main text.
- [Performance benchmarks section] The performance tables list scan rates but do not tabulate the corresponding pixel resolution or noise floor for each instrument; a single consolidated table would aid comparison.
Simulated Author's Rebuttal
We thank the referee for their positive assessment of the manuscript and the recommendation to accept. The review accurately captures the key advances in portability, AFM compatibility, atom tracking, and performance benchmarks.
Circularity Check
No significant circularity: hardware description with no derivations or predictions
full rationale
The manuscript is a hardware engineering paper describing the redesign, portability, and performance of the FAST module for commercial STMs and AFMs. It supplies interface diagrams, component specifications, benchmark measurements on multiple instruments, and explicit atom-tracking demonstrations. No equations, fitted parameters, predictive models, or derivation chains appear; claims rest on direct empirical verification rather than any self-referential reduction. Self-citation of the prior prototype is present but non-load-bearing, as the new features are independently documented and tested.
Axiom & Free-Parameter Ledger
Reference graph
Works this paper leans on
-
[1]
Data from Scopus retrieved on March 2017 with the following generic query string: KEY (Scanning Tunneling Microscopy OR Scanning Probe Microscopy OR Atomic Force Microscopy) AND DOCTYPE (Ar)
work page 2017
-
[2]
Real-time STM observations of atomic equilibrium fluctuations in an adsorbate system: O/Ru(0001)
Wintterlin, J., J. Trost, S. Renisch, R. Schuster, T. Zambelli, G. Ertl. 1997. "Real-time STM observations of atomic equilibrium fluctuations in an adsorbate system: O/Ru(0001)". Surface Science, V olume 394, Issues 1–3, Pages 159-169, https://doi.org/10.1016/S0039-6028(97)00604-3 13
-
[3]
Rost, M. J., G. J. C. van Baarle, A. J. Katan, W. M. van Spengen, P. Schakel, W. A. van Loo, T. H. Oosterkamp, and J. W. M. Frenken. 2009. Asian Journal of Control, V olume 11, Issue 2, Pages 110-129. https://doi.org/10.1002/asjc.88
-
[4]
Rost, M. J., L. Crama, P. Schakel, E. van Tol, G. B. E. M. van Velzen-Williams, C. F. Overgauw, H. t. Horst, H. Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. van Loo, T. H. Oosterkamp, and J. W. M. Frenken. 2005. Review of Scientific Instruments, V olume 76, Issue 5, 053710. https://doi.org/10.1063/1.1915288
-
[5]
Curtis, Robert, Toshiyuki Mitsui, and Eric Ganz. 1997. Review of Scientific Instruments V olume 68, Issue 7, Pages 2790-2796. https://doi.org/10.1063/1.1148196
-
[6]
Mamin, H. J., H. Birk, P. Wimmer, and D. Rugar. 1994. Journal of Applied Physics, V olume 75, Issue 1, Pages 161-168. https://doi.org/10.1063/1.355877
-
[7]
Scanning Probe Microscopy at Video-Rate
Schitter, Georg, and Marcel J. Rost. 2008. “Scanning Probe Microscopy at Video-Rate”. Materials Today 11. Elsevier BV: 40–48, https://doi.org/10.1016/s1369-7021(09)70006-9
-
[8]
Junkes, H., H.-J. Freund, L. Gura, M. Heyde, P. Marschalik, Z. Yang. 2017. International Conference on Accelerator and Large Experimental Control Systems (16th). https://doi.org/10.18429/JACoW-ICALEPCS2017-THPHA154
-
[9]
Besenbacher, Flemming , Erik Lægsgaard, Ivan Stensgaard. 2005. "Fast-scanning STM studies". Materials Today, V olume 8, Issue 5, Pages 26-30, https://doi.org/10.1016/S1369-7021(05)00843-6
-
[10]
High-Speed Large-Scale Imaging with the Atomic Force Microscope
Barrett, R. C. and C. F. Quate. 1991. “High-Speed Large-Scale Imaging with the Atomic Force Microscope”. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9 (2). American Vacuum Society: 302, https://doi.org/10.1116/1.585610
-
[11]
Atomic Force Microscopy Using Small Cantilevers. In Micromachining and Imaging
Walters, Deron A., Mario Viani, George T. Paloczi, Tilman E. Schaeffer, Jason P. Cleveland, Mark A. Wendman, Gus Gurley, Virgil B. Elings, and Paul K. Hansma. 1997. “Atomic Force Microscopy Using Small Cantilevers. In Micromachining and Imaging”, edited by Terry A. Michalske and Mark A. Wendman. SPIE, https://doi.org/10.1117/12.271227
-
[12]
Compensator design for improved counterbalancing in high speed atomic force microscopy,
I. S. Bozchalooi, K. Youcef-Toumi, D. J. Burns, and G. E. Fantner, “Compensator design for improved counterbalancing in high speed atomic force microscopy,” Rev. Sci. Instrum. 82(11), 113712 (2011). https://doi.org/10.1063/1.3663070
-
[13]
Components for high speed atomic force microscopy,
G. E. Fantner, G. Schitter, J. H. Kindt, T. Ivanov, K. Ivanova, R. Patel, N. Holten-Andersen, J. Adams, P. J. Thurner, I. W. Rangelow, and P. K. Hansma, “Components for high speed atomic force microscopy,” Ultramicroscopy 106(8–9), 881–887 (2006). https://doi.org/10.1016/j.ultramic.2006.01.015
-
[14]
MEMS-based high speed scanning probe microscopy,
E. C. M. Disseldorp, F. C. Tabak, A. J. Katan, M. B. S. Hesselberth, T. H. Oosterkamp, J. W. M. Frenken, and W. M. van Spengen, “MEMS-based high speed scanning probe microscopy,” Rev. Sci. Instrum. 81(4), 043702 (2010). https://doi.org/10.1063/1.3361215
-
[15]
A new control strategy for high-speed atomic force microscopy,
G. Schitter, F. Allgöwer, and A. Stemmer, “A new control strategy for high-speed atomic force microscopy,” Nanotechnology 15(1), 108–114 (2004). https://doi.org/10.1088/0957-4484/15/1/021 14
-
[16]
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
Swartzentruber, B. S. 1996. “Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy”. Physical Review Letters 76 (3). American Physical Society (APS): 459–62, https://doi.org/10.1103/physrevlett.76.459
-
[17]
Pohl, D. W., and R. Möller. 1987. Review of Scientific Instruments V olume 59, Issue 6, Pages 840-842. https://doi.org/10.1063/1.1139790
-
[18]
Esch, Friedrich, Carlo Dri, Alessio Spessot, Cristina Africh, Giuseppe Cautero, Dario Giuressi, Rudi Sergo, Riccardo Tommasini, and Giovanni Comelli. 2011. “The FAST Module: An Add-on Unit for Driving Commercial Scanning Probe Microscopes at Video Rate and Beyond”. Review of Scientific Instruments 82 (5): 053702, https://doi.org/10.1063/1.3585984
-
[19]
Dri, Carlo, Friedrich Esch, Cristina Africh, and Giovanni Comelli. 2012. “How to Select Fast Scanning Frequencies for High-Resolution Fast STM Measurements with a Conventional Microscope”. Measurement Science and Technology 23 (5): 055402, https://doi.org/10.1088/0957- 0233/23/5/055402
-
[20]
Patents US8726409B2 and EP2428804B1
-
[21]
Patera, Laerte L, Federico Bianchini, Giulia Troiano, Carlo Dri, Cinzia Cepek, Maria Peressi, Cristina Africh and Giovanni Comelli. 2014. “Temperature-driven changes of the graphene edge structure on Ni (111): Substrate vs hydrogen passivation”. Nano Letters, V olume 15, Issue 1, Pages 56-62, https://doi.org/10.1021/nl5026985
-
[22]
Real-time imaging of adatom-promoted graphene growth on nickel
Patera, Laerte L, Federico Bianchini, Cristina Africh, Carlo Dri, German Soldano, Marcelo M Mariscal, Maria Peressi and Giovanni Comelli. 2018. “Real-time imaging of adatom-promoted graphene growth on nickel”. Science, V olume 359, Issue 6381, Pages 1243-1246., https://doi.org/10.1126/science.aan8782
-
[23]
Patera, Laerte L, Zhiyu Zou, Carlo Dri, Cristina Africh, Jascha Repp and Giovanni Comelli
-
[24]
Imaging on-surface hierarchical assembly of chiral supramolecular networks
“Imaging on-surface hierarchical assembly of chiral supramolecular networks”. Physical Chemistry Chemical Physics, V olume 19, Issue 36, Pages 24605-24612., https://doi.org/10.1039/C7CP01341H
-
[25]
A Microscopy Approach to Investigating the Energetics of Small Supported Metal Clusters
Lechner, Barbara AJ, Fabian Knoller, Alexander Bourgund, Ueli Heiz and Friedrich Esch. “A Microscopy Approach to Investigating the Energetics of Small Supported Metal Clusters”. The Journal of Physical Chemistry C, V olume 122, Issue 39, Pages 22569-22576 (2018), https://doi.org/ 10.1021/acs.jpcc.8b06866
-
[26]
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Haugstad, G. 2012. “Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications”. John Wiley & Sons, Inc., https://doi.org/10.1002/9781118360668.fmatter
-
[27]
Sub-10 Nm Resistless Nanolithography for Directed Self-Assembly of Block Copolymers
Fernández-Regúlez, Marta, Laura Evangelio, Matteo Lorenzoni, Jordi Fraxedas, and Francesc Pérez-Murano. 2014. “Sub-10 Nm Resistless Nanolithography for Directed Self-Assembly of Block Copolymers”. ACS Applied Materials & Interfaces 6 (23). American Chemical Society (ACS): 21596–602, https://doi.org/10.1021/am506600m
-
[28]
Highly Stable Atom-Tracking Scanning Tunneling Microscopy
Rerkkumsup, Pongpun, Masato Aketagawa, Koji Takada, Yoichi Togawa, Nguyen Tien Thinh, and Yosuke Kozuma. 2004. “Highly Stable Atom-Tracking Scanning Tunneling Microscopy”. 15 Review of Scientific Instruments 75 (4). AIP Publishing: 1061–67, https://doi.org/10.1063/1.1651637
-
[29]
Flexible Drift-Compensation System for Precise 3D Force Mapping in Severe Drift Environments
Rahe, Philipp, Jens Schütte, Werner Schniederberend, Michael Reichling, Masayuki Abe, Yoshiaki Sugimoto, and Angelika Kühnle. 2011. “Flexible Drift-Compensation System for Precise 3D Force Mapping in Severe Drift Environments”. Review of Scientific Instruments 82 (6). AIP Publishing: 063704, https://doi.org/10.1063/1.3600453
-
[30]
http://www.specs-zurich.com/upload/cms/user/Specs-AT4.pdf
-
[31]
Colloquium: Time-Resolved Scanning Tunneling Microscopy
van Houselt, Arie, and Harold J. W. Zandvliet. 2010. “Colloquium: Time-Resolved Scanning Tunneling Microscopy”. Reviews of Modern Physics 82 (2). American Physical Society (APS): 1593–1605, https://doi.org/10.1103/revmodphys.82.1593
-
[32]
Experimental and Theoretical Study of the Rotation of Si Ad-Dimers on the Si(100) Surface
Swartzentruber, B. S., A. P. Smith, and H. Jónsson. 1996. “Experimental and Theoretical Study of the Rotation of Si Ad-Dimers on the Si(100) Surface”. Physical Review Letters 77 (12). American Physical Society (APS): 2518–21, https://doi.org/10.1103/physrevlett.77.2518
-
[33]
Size-Selected Monodisperse Nanoclusters on Supported Graphene: Bonding Isomerism, and Mobility
Wang, Bo, Bokwon Yoon, Michael König, Yves Fukamori, Friedrich Esch, Ueli Heiz, and Uzi Landman. 2012. “Size-Selected Monodisperse Nanoclusters on Supported Graphene: Bonding Isomerism, and Mobility”. Nano Letters 12 (11). American Chemical Society (ACS): 5907–12, https://doi.org/10.1021/nl303319f
-
[34]
Fundamental Insight into the Substrate-Dependent Ripening of Monodisperse Clusters
Fukamori, Yves, Michael König, Bokwon Yoon, Bo Wang, Friedrich Esch, Ueli Heiz, and Uzi Landman. 2013. “Fundamental Insight into the Substrate-Dependent Ripening of Monodisperse Clusters”. ChemCatChem 5 (11). Wiley: 3330–41, https://doi.org/10.1002/cctc.201300250
-
[35]
Ethene to Graphene: Surface Catalyzed Chemical Pathways, Intermediates, and Assembly
Wang, Bo, Michael König, Catherine J. Bromley, Bokwon Yoon, Michael-John Treanor, José A. Garrido Torres, Marco Caffio, Federico Grillo, Herbert Früchtl, Neville V . Richardson, Friedrich Esch, Ueli Heiz, Uzi Landman, and Renald Schaub. 2017. “Ethene to Graphene: Surface Catalyzed Chemical Pathways, Intermediates, and Assembly”. J. Phys. Chem. C, 2017, 12...
-
[36]
https://fastmodule.iom.cnr.it 16
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