EBSD pattern quality metrics in silicon exhibit strong modulations that follow the underlying electron channeling pattern in both raw and corrected data.
Integrated plasmonic metasurfaces for spectropolarimetry
5 Pith papers cite this work. Polarity classification is still indexing.
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Inverse-designed metasurface combines full-Stokes polarimetry and wavefront sensing in a single continuous aperture, achieving 0.046 mean polarization reconstruction error with neural network assistance.
A 7 cm sapphire photonic crystal fiber Bragg grating temperature sensor was fabricated with 6x faster processing and showed 19-32 pm/°C sensitivity from 25-1200°C.
Up-conversion detection converts mid-IR CO absorption to visible band for cavity-free in-situ sensing, reaching 79.6 ppb sensitivity over 0.14 m path with silicon detector and single-photon level detection via SPAD.
Presents an improved add-on module for high-speed time-resolved scanning probe microscopy on commercial instruments with added AFM compatibility and atom tracking.
citing papers explorer
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Channeling-in channeling-out revisited: selected area electron channeling and electron backscatter diffraction
EBSD pattern quality metrics in silicon exhibit strong modulations that follow the underlying electron channeling pattern in both raw and corrected data.
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Inverse designed full-Stokes polarimetric metasurface with simultaneous wavefront sensing for visible light
Inverse-designed metasurface combines full-Stokes polarimetry and wavefront sensing in a single continuous aperture, achieving 0.046 mean polarization reconstruction error with neural network assistance.
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Sapphire Photonic Crystal Fiber Sensor
A 7 cm sapphire photonic crystal fiber Bragg grating temperature sensor was fabricated with 6x faster processing and showed 19-32 pm/°C sensitivity from 25-1200°C.
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Mid-infrared high-sensitive cavity-free in-situ CO gas sensing based on up-conversion detection
Up-conversion detection converts mid-IR CO absorption to visible band for cavity-free in-situ sensing, reaching 79.6 ppb sensitivity over 0.14 m path with silicon detector and single-photon level detection via SPAD.
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The new FAST module: a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Presents an improved add-on module for high-speed time-resolved scanning probe microscopy on commercial instruments with added AFM compatibility and atom tracking.