SR-XRT under six-beam conditions reveals kinematical-to-dynamical transition and determines a-type Burgers vectors of TEDs in thick ammonothermal GaN via g·b invisibility and image-width matching.
Suvorov, X-ray topography: yesterday, today, and prospects for the future, J
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X-ray topography shows high crystalline quality (26 arcsec FWHM) beneath the seed in OCCC-grown β-Ga2O3 with <010> screw dislocations at ~10^5 cm^{-2} and twist misorientation during diameter enlargement.
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Kinematical and dynamical contrast of dislocations in thick GaN substrates observed by synchrotron-radiation X-ray topography under six-beam diffraction conditions
SR-XRT under six-beam conditions reveals kinematical-to-dynamical transition and determines a-type Burgers vectors of TEDs in thick ammonothermal GaN via g·b invisibility and image-width matching.
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Synchrotron-radiation X-ray topography and reticulography of bulk $\beta$-Ga$_2$O$_3$ crystals grown by the cold crucible method
X-ray topography shows high crystalline quality (26 arcsec FWHM) beneath the seed in OCCC-grown β-Ga2O3 with <010> screw dislocations at ~10^5 cm^{-2} and twist misorientation during diameter enlargement.