A review chapter summarizing STEM techniques and applications to oxide interfaces, including interfacial conductivity, charge screening, and emerging AI-guided methods.
V.et al.Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy.ACS Nano15,12604–12627
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Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy
A review chapter summarizing STEM techniques and applications to oxide interfaces, including interfacial conductivity, charge screening, and emerging AI-guided methods.