Multilayer Laue lenses as objectives in dark-field X-ray microscopy deliver 56 nm spatial resolution, more than three times better than compound refractive lenses.
Morgan and Mauro Prasciolu and Andrzej Andrejczuk and Jacek Krzywinski and Alke Meents and David Pennicard and Heinz Graafsma and Anton Barty and Richard J
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
cond-mat.mtrl-sci 1years
2026 1verdicts
ACCEPT 1representative citing papers
citing papers explorer
-
Multilayer Laue Lenses for Enhanced Spatial Resolution in Dark-Field X-ray Microscopy
Multilayer Laue lenses as objectives in dark-field X-ray microscopy deliver 56 nm spatial resolution, more than three times better than compound refractive lenses.