VVV near-infrared photometry suffers from zero-point biases caused by blended 2MASS standards and H-band detector nonlinearity; per-chip corrections with tight 2MASS matching remove most of the bias.
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On the optimal calibration of VVV photometry
VVV near-infrared photometry suffers from zero-point biases caused by blended 2MASS standards and H-band detector nonlinearity; per-chip corrections with tight 2MASS matching remove most of the bias.