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The evolution of AI from image interpretation toward scientific inference in nanoparticle electron microscopy
ref [130] · 2607.10388 · notice #7876 · dispute
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Maksov, A.; Dyck, O.; Wang, K.; Xiao, K.; Geohegan, D. B.; Jesse, S.; Kalinin, S. V.; Ziatdinov, M. Deep Learning Analysis of Defect and Phase Evolution During Electron Beam Induced Transformations. npj Comput. Mater. 2019, 5, 1. https://doi.org/10.1038/s41524-019-0152-9