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Citation notice #10177 · 2026-08-14 18:18:48.851462+00:00

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope

Correction Crossref Open

cites Campbell, P, which carries a correction notice dated 2020-01-09. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.

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01Evidence

Raw extraction · bibliography line · bibliography index 37

A. Campbell, P. Murray, E. Yakushina, S. Marshall, W. Ion, New methods for automatic quantification of microstructural features using digital image processing, Mater. Des. 141 (2018) 395–406. doi:10.1016/j.matdes.2017.12.049

02Event

Type
Correction
Source
Crossref
Original DOI
10.1016/j.matdes.2017.12.049
Notice DOI
10.1016/j.matdes.2019.108454
Date
2020-01-09
Title
Corrigendum to “New methods for automatic quantification of microstructural features using digital image processing” [Mater. Des. 2018 395–406]
Reasons
['Erratum']
Work
Campbell, P (2018)

Schema constants (for re-runners): correction · crossref

03Dispute this notice

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