Citation notice #10177 · 2026-08-14 18:18:48.851462+00:00
Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope
Correction
Crossref
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cites Campbell, P, which carries a correction notice dated 2020-01-09. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.
Citing paper Event page Original DOI Notice DOI File a formal challenge All reference changes
01Evidence
Raw extraction · bibliography line · bibliography index 37
A. Campbell, P. Murray, E. Yakushina, S. Marshall, W. Ion, New methods for automatic quantification of microstructural features using digital image processing, Mater. Des. 141 (2018) 395–406. doi:10.1016/j.matdes.2017.12.049
02Event
- Type
- Correction
- Source
- Crossref
- Original DOI
- 10.1016/j.matdes.2017.12.049
- Notice DOI
- 10.1016/j.matdes.2019.108454
- Date
- 2020-01-09
- Title
- Corrigendum to “New methods for automatic quantification of microstructural features using digital image processing” [Mater. Des. 2018 395–406]
- Reasons
- ['Erratum']
- Work
- Campbell, P (2018)
03Dispute this notice
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