Citation notice #7114 · 2026-07-11 11:50:59.969068+00:00

Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes

Correction Crossref Open

cites 2024 , volume =, which carries a correction notice dated 2025-04-24. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.

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01Evidence

Raw extraction · bibliography line · bibliography index 6

May, A.; Rommel, M.; Baier, L.; Schraml, M.; Dick, J. F.; Jank, M. P. M.; Schulze, J. A 4H- SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C. 2024 Smart Systems Integration Conference and Exhibition (SSI), Hamburg, Germany, 2024, 1 – 5, DOI:10.1109/SSI63222.2024.10740550

02Event

Type: Correction
Source: Crossref
Original DOI: 10.1080/13183222.2024.2383905
Notice DOI: 10.1080/13183222.2025.2483622
Date: 2025-04-24
Title: Correction
Reasons: ['Correction']
Work: 2024 , volume = (2024) Javnost - The Public

Schema constants (for re-runners): correction · crossref

03Dispute this notice

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