Citation notice #7705 · 2026-07-11 11:51:01.592913+00:00
Material selection for mid-infrared thin-film coatings and windows
Correction
Crossref
Open
cites 10.1016/j.tsf.2022.139568, which carries a correction notice dated 2023-11-28. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.
Citing paper Cited paper on Pith Event page Original DOI Notice DOI File a formal challenge All reference changes
01Evidence
Raw extraction · bibliography line · bibliography index 38
L. Y. Beliaev, E. Shkondin, A. V. Lavrinenko, and O. Takayama, “Optical, structural and composition properties of silicon nitride films deposited by reactive radio-frequency sputtering, low pressure and plasma-enhanced chemical vapor deposition,” Thin Solid Films, vol. 763, pp. 139568, 2022, doi: 10.1016/j.tsf.2022.139568
02Event
- Type
- Correction
- Source
- Crossref
- Original DOI
- 10.1016/j.tsf.2022.139568
- Notice DOI
- 10.1016/j.tsf.2023.140124
- Date
- 2023-11-28
- Title
- Corrigendum to: “Optical, structural and composition properties of silicon nitride films deposited by reactive radio-frequency sputtering, low pressure and plasma-enhanced chemical vapor deposition” [Thin Solid Films (2023) 139568]
- Reasons
- ['Erratum']
- Work
- - (2022) Thin Solid Films
03Dispute this notice
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