Citation notice #8632 · 2026-08-06 00:19:25.695398+00:00

Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imaging

cites Batson, N, which carries a correction notice dated 2002-10-25. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.

This is not a judgment on the citing paper.

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01Evidence

Raw extraction · citation context · bibliography index 2

microscopy experiments. References 24 [1] M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, K. Urban, Electron microscopy image enhanced, Nature 392 (1998) 768-769. https://doi.org/10.1038/33823. [2] P.E. Batson, N. Dellby, O.L. Krivanek, Sub -ångstrom resolution using aberration corrected electron optics, Nature 418 (2002) 617-620. https://doi.org/10.1038/nature00972. [3] B.D.A. Levin, Direct detectors and their applications in electron microscopy for materials science, J. Phys. Mater. 4 (2021) 042005. https://doi.org/10.1088/2515-7639/ac0ff9. [4] J.J.P. Peters, T. Mullarkey, E. Hedley, K.H. Müller, A. Porter, A. Mostaed, L. Jones, Electron counting detectors in scanning transmission electron microscopy via hardware signal

02Event

Type

Correction

Source

Crossref

Original DOI

10.1038/nature00972

Notice DOI

10.1038/nature01058

Date

2002-10-25

Title

Erratum: corrigendum: Sub-ångstrom resolution using aberration corrected electron optics

Reasons

['Erratum']

Work

Batson, N (2002)

Schema constants (for re-runners): correction · crossref

03Dispute this notice

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