Reference change · 10.1038/nature00972

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Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imaging

ref [2] · 2608.03344 · notice #8632 · dispute

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microscopy experiments. References 24 [1] M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, K. Urban, Electron microscopy image enhanced, Nature 392 (1998) 768-769. https://doi.org/10.1038/33823. [2] P.E. Batson, N. Dellby, O.L. Krivanek, Sub -ångstrom resolution using aberration corrected electron optics, Nature 418 (2002) 617-620. https://doi.org/10.1038/nature00972. [3] B.D.A. Levin, Direct detectors and their applications in electron microscopy for materials science, J. Phys. Mater. 4 (2021) 042005. https://doi.org/10.1088/2515-7639/ac0ff9. [4] J.J.P. Peters, T. Mullarkey, E. Hedley, K.H. Müller, A. Porter, A. Mostaed, L. Jones, Electron counting detectors in scanning transmission electron microscopy via hardware signal

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