Citation notice #9528 · 2026-08-11 00:18:04.574321+00:00

Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials

Correction Crossref Open

cites 10.1038/s42254-019-0058-y, which carries a correction notice dated 2019-07-31. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.

This is not a judgment on the citing paper.

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01Evidence

Raw extraction · bibliography line · bibliography index 208

T. Susi, J. C. Meyer, J. Kotakoski, Quantifying trans- mission electron microscopy irradiation effects using two-dimensional materials, Nature Reviews Physics 1 (6) (2019) 397–405. doi:10.1038/s42254-019-0058-y . URL http://dx.doi.org/10.1038/ s42254-019-0058-yhttps://www.nature.com/ articles/s42254-019-0058-y

02Event

Type: Correction
Source: Crossref
Original DOI: 10.1038/s42254-019-0058-y
Notice DOI: 10.1038/s42254-019-0096-5
Date: 2019-07-31
Title: Publisher Correction: Quantifying transmission electron microscopy irradiation effects using two-dimensional materials
Reasons: ['Correction']
Work: - (2019)

Schema constants (for re-runners): correction · crossref

03Dispute this notice

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