X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced N\'eel-cap reversal

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on N\'eel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of N\'eel-cap magnetization give clear evidence for the magnetization reversal of the N\'eel caps around 120 mT, with a $\pm$20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.