Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes
classification
❄️ cond-mat.mes-hall
cond-mat.str-el
keywords
electric-field-sensitivemethodmodelingmultiple-electronresonancesscanningsingle-analytical
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We have developed a modeling method suitable to analyze single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.
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