Sparse Aperture Masking (SAM) at NAOS/CONICA on the VLT
pith:O4DVXCXE Add to your LaTeX paper
What is a Pith Number?\usepackage{pith}
\pithnumber{O4DVXCXE}
Prints a linked pith:O4DVXCXE badge after your title and writes the identifier into PDF metadata. Compiles on arXiv with no extra files. Learn more
read the original abstract
The new operational mode of aperture masking interferometry has been added to the CONICA camera which lies downstream of the Adaptive Optics (AO) corrected focus provided by NAOS on the VLT-UT4 telescope. Masking has been shown to deliver superior PSF calibration, rejection of atmospheric noise and robust recovery of phase information through the use of closure phases. Over the resolution range from about half to several resolution elements, masking interferometry is presently unsurpassed in delivering high fidelity imaging and direct detection of faint companions. Here we present results from commissioning data using this powerful new operational mode, and discuss the utility for masking in a variety of scientific contexts. Of particular interest is the combination of the CONICA polarimetry capabilities together with SAM mode operation, which has revealed structures never seen before in the immediate circumstellar environments of dusty evolved stars.
This paper has not been read by Pith yet.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.