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arxiv: 1502.00450 · v2 · pith:3O67DO5Nnew · submitted 2015-02-02 · 🧮 math.PR · math-ph· math.MP

Critical exponents on Fortuin--Kasteleyn weighted planar maps

classification 🧮 math.PR math-phmath.MP
keywords fracplanarassociatedcriticalexponentfortuin--kasteleynkappamaps
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In this paper we consider random planar maps weighted by the self-dual Fortuin--Kasteleyn model with parameter $q \in (0,4)$. Using a bijection due to Sheffield and a connection to planar Brownian motion in a cone we obtain rigorously the value of the critical exponent associated with the length of cluster interfaces, which is shown to be $$ \frac{4}{\pi} \arccos \left( \frac{\sqrt{2 - \sqrt{q}}}{2} \right)=\frac{\kappa'}{8}. $$ where $\kappa' $ is the SLE parameter associated with this model. We also derive the exponent corresponding to the area enclosed by a loop which is shown to be 1 for all values of $q \in (0,4)$. Applying the KPZ formula we find that this value is consistent with the dimension of SLE curves and SLE duality.

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