Far field imaging of a dielectric inclusion
classification
🧮 math-ph
math.MP
keywords
fielddielectricinclusionaccountalgorithmamplitudeanalyzedcases
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A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.
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