Multi-parameter Quantum Metrology
classification
🪐 quant-ph
keywords
quantummetrologymulti-parameteradvancesbackgroundbetterchallengesclassically
read the original abstract
The simultaneous quantum estimation of multiple parameters can provide a better precision than estimating them individually. This is an effect that is impossible classically. We review the rich background of multi-parameter quantum metrology, some of the main results in the field and its recent advances. We close by highlighting future challenges and open questions.
This paper has not been read by Pith yet.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.