High-sensitivity, spin-based electrometry with an ensemble of nitrogen-vacancy centers in diamond

We demonstrate a spin-based, all-dielectric electrometer based on an ensemble of nitrogen-vacancy (NV$^-$) defects in diamond. An applied electric field causes energy level shifts symmetrically away from the NV$^-$'s degenerate triplet states via the Stark effect; this symmetry provides immunity to temperature fluctuations allowing for shot-noise-limited detection. Using an ensemble of NV$^-$s, we demonstrate shot-noise limited sensitivities approaching 1 V/cm/$\sqrt{\text{Hz}}$ under ambient conditions, at low frequencies ($<$10 Hz), and over a large dynamic range (20 dB). A theoretical model for the ensemble of NV$^-$s fits well with measurements of the ground-state electric susceptibility parameter, $\langle k_\perp\rangle$. Implications of spin-based, dielectric sensors for micron-scale electric-field sensing are discussed.