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Measurements of Angle-Resolved Reflectivity of PTFE in Liquid Xenon with IBEX

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arxiv 1909.08730 v4 pith:TTE7NZ72 submitted 2019-09-18 physics.ins-det

S. Kravitz , R.J. Smith , L. Hagaman , E.P. Bernard , D.N. McKinsey , L. Rudd , L. Tvrznikova , G.D. Orebi Gann
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M. Sakai
This is my paper · ORCID
classification physics.ins-det
keywords xenonreflectivityptfelightliquidangulardependencehigh
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Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

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