Pith. sign in

REVIEW

SeeABLE: Soft Discrepancies and Bounded Contrastive Learning for Exposing Deepfakes

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2211.11296 v2 pith:VFU2AY26 submitted 2022-11-21 cs.CV

classification cs.CV
keywords seeabledeepfakedetectorsboundedcapabilitiescontrastivedeepfakesdetection
verification ladder T0 review T1 audit T2 compute T3 formal

Signed reviews

No signed human review yet.

0 comments
read the original abstract

Modern deepfake detectors have achieved encouraging results, when training and test images are drawn from the same data collection. However, when these detectors are applied to images produced with unknown deepfake-generation techniques, considerable performance degradations are commonly observed. In this paper, we propose a novel deepfake detector, called SeeABLE, that formalizes the detection problem as a (one-class) out-of-distribution detection task and generalizes better to unseen deepfakes. Specifically, SeeABLE first generates local image perturbations (referred to as soft-discrepancies) and then pushes the perturbed faces towards predefined prototypes using a novel regression-based bounded contrastive loss. To strengthen the generalization performance of SeeABLE to unknown deepfake types, we generate a rich set of soft discrepancies and train the detector: (i) to localize, which part of the face was modified, and (ii) to identify the alteration type. To demonstrate the capabilities of SeeABLE, we perform rigorous experiments on several widely-used deepfake datasets and show that our model convincingly outperforms competing state-of-the-art detectors, while exhibiting highly encouraging generalization capabilities.

Discussion (0). Continue with ORCID to comment.

Pith tools