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Capturing thin structures in VOF simulations with two-plane reconstruction

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arxiv 2403.10729 v1 pith:QRN2NILI submitted 2024-03-15 physics.flu-dyn physics.comp-ph

classification physics.flu-dynphysics.comp-ph
keywords interfacereconstructionalgorithmfilmsplanesthinefficientoptimization
verification ladder T0 review T1 audit T2 compute T3 formal
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A novel interface reconstruction strategy for volume of fluid (VOF) methods is introduced that represents the liquid-gas interface as two planes that co-exist within a single computational cell. In comparison to the piecewise linear interface calculation (PLIC), this new algorithm greatly improves the accuracy of the reconstruction, in particular when dealing with thin structures such as films. The placement of the two planes requires the solution of a non-linear optimization problem in six dimensions, which has the potential to be overly expensive. An efficient solution to this optimization problem is presented here that exploits two key ideas: an algorithm for extracting multiple plane orientations from transported surface data, and an efficient and mass-conserving distance-finding algorithm that accounts for two planes with arbitrary orientation. Additionally, a simple and robust strategy is presented to accurately represent the surface tension forces produced at the interface of subgrid-thickness films. The performance of this new VOF reconstruction is demonstrated on several test cases that illustrate the capability to handle arbitrarily thin films.

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