Pith. sign in

REVIEW

Temperature dependence of the AB-lines and Optical Properties of the Carbon-Antisite Vacancy Pair in 4H-SiC

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2408.06823 v1 pith:VKKDU5QM submitted 2024-08-13 cond-mat.mtrl-sci

classification cond-mat.mtrl-sci
keywords ab-lineslinestemperaturebeendefectopticalpropertiesquantum
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

Defects in semiconductors have in recent years been revealed to have interesting properties in the venture towards quantum technologies. In this regard, silicon carbide has shown great promise as a host for quantum defects. In particular, the ultra-bright AB photoluminescence lines in 4H-SiC are observable at room temperature and have been proposed as a single-photon quantum emitter. These lines have been previously studied and assigned to the carbon antisite-vacancy pair (CAV). In this paper, we report on new measurements of the AB-lines' temperature dependence, and carry out an in-depth computational study on the optical properties of the CAV defect. We find that the CAV defect has the potential to exhibit several different zero-phonon luminescences with emissions in the near-infrared telecom band, in its neutral and positive charge states. However, our measurements show that the AB-lines only consist of three non-thermally activated lines instead of the previously reported four lines, meanwhile our calculations on the CAV defect are unable to find optical transitions in full agreement with the AB-line assignment. In the light of our results, the identification of the AB-lines and the associated room temperature emission require further study.

Discussion (0). Sign in to comment.

Pith tools