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Preliminary characterization of a surface electrode Paul trap for frequency metrology

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arxiv 2410.06639 v1 pith:YWJ3SBW5 submitted 2024-10-09 physics.atom-ph physics.ins-detquant-ph

classification physics.atom-phphysics.ins-detquant-ph
keywords chiptrapelectricmeasurementsperformedtrappingbreakdowncharacterization
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abstract

We are developing a single-ion optical clock based on a surface-electrode (SE) trap that we will operate with $^{171}$Yb$^+$ ions on the electric quadrupole transition at 435.5 nm. We present heating rate measurements performed with a prototype SE trap. We also introduce a new, micro-fabricated SE trapping chip using silicon on insulator technology. Electric tests were performed under ultra-high vacuum using a testing chip, including breakdown voltages measurements and flashover detection. We present suitable trapping parameters for this chip, as well as a road-map for improving its design.

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