Shot noise of coupled semiconductor quantum dots

The low-frequency shot noise properties of two electrostatically coupled semiconductor quantum dot states which are connected to emitter/collector contacts are studied. A master equation approach is used to analyze the bias voltage dependence of the Fano factor as a measure of temporal correlations in tunneling current caused by Pauli's exclusion principle and the Coulomb interaction. In particular, the influence of the Coulomb interaction on the shot noise behavior is discussed in detail and predictions for future experiments will be given. Furthermore, we propose a mechanism for negative differential conductance and investigate the related super-Poissonian shot noise.